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Well-suited for a wide variety of shooting situations the FUJIFILM XF 16-80mm f/4 R OIS WR is a versatile 24-120mm-equivalent zoom spanning wide-angle to medium-telephoto and featuring a constant f/4 maximum aperture. Complementing this flexible design is an advanced optical layout which includes a trio of aspherical elements and one ED aspherical element that help to minimize a variety of aberrations in order to produce high sharpness and clarity. A Super EBC coating also improves contrast and color neutrality by reducing flare and ghosting when working in strong lighting conditions. Also benefiting use in a variety of situations is a quick and quiet autofocus system along with a six stop-effective image stabilization system that minimizes the appearance of camera shake. Additionally the lens is fully weather-sealed for working in inclement conditions. Standard zoom is designed for APS-C-format Fujifilm X-mount mirrorless cameras and offers a 24-120mm equivalent focal length range. One extra-low dispersion aspherical element is used greatly reduce color fringing and chromatic aberrations in order to produce high clarity and color fidelity throughout the zoom range. Three aspherical elements control distortion and spherical aberrations which helps to improve sharpness and realize more accurate rendering. A Super EBC Electron Beam Coating coating has been applied to the entire surface of each element to for controlling ghosting and flare for greater contrast and color accuracy. Quick and quiet autofocus performance benefits both stills and video applications. An advanced Optical Image Stabilization system minimizes the appearance of camera shake by up to six stops to enable sharper imaging when working with longer focal lengths or slower shutter speeds. Weather-sealed lens body protects against dust and moisture and to enable worry-free use in inclement conditions and freezing temperatures as low as 14F. Rounded nine-blade diaphragm contributes to a pleasing out-of-focus quality to benefit the use of selective focus and shallow depth of field techniques.